PC29.09.0100A【PDF 6/13 页】ANTENNA PCB GSM WCDMA

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Sheet目录56

2页 3页 4页 5页 [6页]7页 8页 9页 10页

SPE-11-8-045/B

05-August-2011

Page 6 of 13

6.0 Environmental Conditions and Reliability

6.1 Environmental Conditions

2.1.1 Operation Temperature

-40?/SPAN>C to + 85?/SPAN>C

2.1.2 Storage Temperature

-40?/SPAN>C to + 95?/SPAN>C

2.1.3 Relative Humidity

40% to 95%

6.2 Reliability

Test Items

Procedure

Requirement

hermal Shock

Starting at -40 for 30minutes and then cycled to +85

to remain 30minutes (a complete cycle).

To repeat 5 complete cycles.

(Refer to IEC 68-2-14 Method Na)

1. The value of return loss must be within

product specifications after this test.

2. No physical deformation should be evident.

Storage

Temperature

(Cold)

Samples must be put into -30癈 chamber for 72

hours and samples shall be powered during test.

(Refer to IEC 68-2-1 Method Aa)

1. The value of return loss must be within

product specifications after this test.

2. No physical deformation should be evident.

Storage

Temperature

(Dry Heat)

Samples must be put into +75癈 chamber for 72

hours and samples shall be powered during test.

(Refer to IEC 68-2-1 Method Ba)

1. The value of return loss must be within

product specifications after this test.

2. No physical deformation should be evident.

Operating

Temperature

(Cold)

Samples must be put into -20癈 chamber for 2

hours and samples shall be powered during test.

(Refer to IEC 68-2-1 Method Aa)

1. The value of return loss must met specification

during test/after test

2. No mechanical defects after test.

Operating

Temperature

(Dry Heat)

Samples must be put into +65癈 chamber for 72

hours and samples shall be powered during test.

(Refer to IEC 68-2-1 Method Ba)

1. The value of return loss must met specification

during test/after test

2. no mechanical defects after test.

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